Modern Developments and Applications in Microbeam Analysis, Proceedings of the 7th Workshop of the European Microbeam Analysis Society (EMAS), May 6-10, 2001, Tampere, FinlandHEIKINHEIMO, Erkki; WALKER, Clive Thomas; ARMIGLIATO, Aldo et al.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, issn 0026-3672, 190 p.Conference Proceedings

Applications of microanalysis in the cultural heritage fieldJOOSTEN, Ineke.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 295-299, issn 0026-3672, 5 p.Conference Paper

Examples of quantification in XPS on 5f materialsGOUDER, Thomas; HAVELA, Ladislav.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 207-215, issn 0026-3672Conference Paper

Chemical interactions by low-energy electron-induced X-ray emission spectroscopy, LEXESBONNELLE, Christiane.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 275-282, issn 0026-3672Conference Paper

Proceedings of the European Microbeam Analysis Society (EMAS)VAN'T DACK, L; GIJBELS, R; WALKER, C. T et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, issn 0026-3672, 201 p.Conference Proceedings

Modern Developments and Application in Microbeam Analysis. Proceedings of the 8th Workshop of the European Microbeam Analysis Society (EMAS), Chiclana de la Frontera, Spain, May 18-22, 2003. Part 2LLOVET, X; SALVAT, F; WALKER, C. T et al.Mikrochimica acta (1966. Print). 2004, Vol 147, Num 3, issn 0026-3672, 63 p.Conference Proceedings

EPMA present and futureLOVE, Glyn.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 115-124, issn 0026-3672Conference Paper

Quantitative high resolution electron microscopyVAN DYCK, D.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 153-180, issn 0026-3672Conference Paper

Monitoring fibre surfaces with XPS in papermaking processesJOHANSSON, Leena-Sisko.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 217-223, issn 0026-3672Conference Paper

Soft X-rays and low-voltage SEM in practiceKUYPERS, Stefan.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 235-247, issn 0026-3672Conference Paper

The legacy of Raimond CastaingGRILLON, Francois; PHILIBERT, Jean.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 99-104, issn 0026-3672Conference Paper

X-ray microanalysis of thin surface films and coatingsPOUCHOU, Jean-Louis.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 133-152, issn 0026-3672Conference Paper

Improving matrix correctionsJOY, David C.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 105-113, issn 0026-3672Conference Paper

Applications of electron microbeam analysis in the earth sciencesBOWLES, John F. W.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 125-131, issn 0026-3672Conference Paper

Analytical potential of EDS at low voltagesBOYES, Edward D.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 225-234, issn 0026-3672Conference Paper

Block lift-out sample preparation for 3D experiments in a dual beam focused ion beam microscopeSCHAFFER, Miroslava; WAGNER, Julian.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 421-425, issn 0026-3672, 5 p.Conference Paper

Light elements microanalysis of steel/B₄C melts for nuclear power plants accident studiesSAO JOAO, Sergio; DURIEZ, Christian; DOMINGUEZ, Cristina et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 343-348, issn 0026-3672, 6 p.Conference Paper

First X-ray fluorescence excited Kossel diffraction in SEMLANGER, Enrico; HASCHKE, Michael; DÄBRITZ, Siegfried et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 455-458, issn 0026-3672, 4 p.Conference Paper

Quantitative analysis of thin specimens in the TEM using a φ(ρz)-modelBOON, Gerben; BASTIN, Guillaume.Mikrochimica acta (1966. Print). 2004, Vol 147, Num 3, pp 125-133, issn 0026-3672, 9 p.Conference Paper

The use of electron backscatter diffraction for the investigation of nano crystalline materials and the move towards orientation imaging in the TEMDINGLEY, David J; NOWELL, Matthew M.Mikrochimica acta (1966. Print). 2004, Vol 147, Num 3, pp 157-165, issn 0026-3672, 9 p.Conference Paper

Application of EPMA and analytical TEM to brazed metal-supported catalytic convertersRICHTER, Silvia; BODE, Hans; DIMYATI, Arbi et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 405-411, issn 0026-3672, 7 p.Conference Paper

Van Gogh's painting grounds : an examination of barium sulphate extender using analytical electron microscopy -SEM/FIB/TEM/EDXHASWELL, R; ZEILE, U; MENSCH, K et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 363-369, issn 0026-3672, 7 p.Conference Paper

Nanometer-scale chemical surface analysis by scanning (tunnelling) atom probesALKEMADE, Paul F. A; GRIBOV, Nicolai N.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 195-206, issn 0026-3672Conference Paper

Structural and chemical analysis of materials with high spatial resolutionVAN BENTHEM, Klaus; KRÄMER, Stephan; SIGLE, Wilfried et al.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 181-193, issn 0026-3672Conference Paper

About the N-series X-ray lines in the electron excited spectra of heavy elementsSCHEFFEL, Andy; DELLITH, Jan; WENDT, Michael et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 471-473, issn 0026-3672, 3 p.Conference Paper